Minimization of the mechanical-stress-induced inaccuracy in bandgap voltage references

IEEE Journal of Solid-State Circuits

Volumn 38, Issue 7, 2003, Pages 1288-1291

  Fruett, Fabiano ^a   Meijer, Gerard C M ^b   Bakker, Anton ^c  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c NXP SEMICONDUCTORS   (Netherlands)

Author keywords

Low drift bandgap; Packaging induced inaccuracy; Piezojunction

Indexed keywords

ELECTRONICS PACKAGING; INTEGRATED CIRCUITS; PIEZOELECTRIC DEVICES; STRESSES;

BANDGAP VOLTAGE REFERENCES;

ELECTRIC POTENTIAL;

EID: 0037480165     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2003.813286     Document Type: Article

References (9)

1. G. C. M. Meijer, "Concepts for bandgap references and voltage measurement systems," in Analog Circuit Design, J. H. Huijsing, R. J. v. d. Plassche, and W. M. C. Sansen, Eds. Boston, MA: Kluwer, 1995, pp. 243-269.
2. D. Manic, J. Petr, and R. S. Popovic, "Measurements of mechanical stress drift in IC plastic packages using the piezo-hall effect," in Proc. 29th Eur. Solid-State Device Conf. (ESSDERC'99), Leuven, Belgium, 1999, pp. 256-259.
3. J. F. Creemer, F. Fruett, G. C. M. Meijer, and P. J. French, "Piezoresistive and piezojunction effects in silicon sensors and circuits," IEEE Sensors J., vol. 1, pp. 98-108, Aug. 2001.
4. F. Fruett and G. C. M. Meijer, The Piezojunction Effect in Silicon Integrated Circuits and Sensors. Boston. MA: Kluwer, 2002.
5. J. F. Creemer, "The effect of mechanical stress on the bipolar transistor characteristics," Ph.D. dissertation, Delft Univ. Technol., Delft, The Netherlands, Jan. 2002.
6. F. Fruett, G. Wang, and G. C. M. Meijer, "The piezojunction effect in NPN and PNP vertical transistors and its influence on silicon temperature sensors," Sensors Actuators A, vol. 85, pp. 70-74, Sept. 2000.
7. G. Wang and G. C. M. Meijer, "The temperature characteristics of bipolar transistors fabricated in CMOS technology," Sensors Actuators A, vol. 87, pp. 81-89, Sept. 2000.
8. G. C. M. Meijer, G. Wang, and F. Fruett, "Temperature sensors and voltage references implemented in CMOS technology," IEEE Sensors J., vol. 1, pp. 225-234, Oct. 2001.
9. A. Bakker, K. Thiele, and J. H. Huijsing, "A CMOS nested-chopper instrumentation amplifier with 100-nV offset," IEEE J. Solid-State Circuits, vol. 35, pp. 1877-1883, Dec. 2000.