Organic bistable devices with high switching voltage

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5522, Issue , 2004, Pages 9-16

  Kawakami, Haruo ^a   Kato, Hisato ^a   Yamashiro, Keisuke ^a   Sekine, Nobuyuki ^a   Kuroda, Masami ^a  

^a FUJI ELECTRIC CO   (Japan)

Author keywords

DODMT; Electrical bistability; Interface layer; Switching voltage; Vacuum evaporation

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRIC FIELDS; ELECTRODES; EVAPORATION; LIGHT EMITTING DIODES; SWITCHING; THICKNESS MEASUREMENT; VACUUM;

DODMT; ELECTRICAL BISTABILITY; INTERFACE LAYER; SWITCHING VOLTAGE; VACCUM EVAPORATION;

ELECTRIC POTENTIAL;

EID: 13444278906     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.557452     Document Type: Conference Paper

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