Magnetic depth profiling of FM/AF/FM trilayers by PNR

Physica B: Condensed Matter

Volumn 356, Issue 1-4 SPEC. ISS., 2005, Pages 46-50

  Schanzer, C ^a   Shah, V R ^a   Gutberlet, T ^b   Gupta, M ^b   Boni P ^a   Braun, H B ^c  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c ETH ZURICH   (Switzerland)

Author keywords

Exchange bias; Interlayer exchange coupling; Magnetic depth profile; Magnetization reversal; Polarized neutron reflectometry

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; FERROMAGNETIC MATERIALS; MAGNETIC DOMAINS; MAGNETIZATION; NEUTRON REFLECTION; POLARIZATION; SPUTTERING; X RAYS;

EXCHANGE BIAS; INTERLAYER EXCHANGE COUPLING; MAGNETIC DEPTH PROFILE; MAGNETIZATION REVERSAL; POLARIZED NEUTRON REFLECTOMETRY;

MULTILAYERS;

EID: 13444278665     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2004.10.044     Document Type: Conference Paper

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