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Volumn 48, Issue 3, 2000, Pages 329-333
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Method for measuring properties of high relative dielectric constant materials in a cutoff waveguide cavity
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Author keywords
[No Author keywords available]
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Indexed keywords
CUTOFF WAVEGUIDE CAVITY;
HIGH RELATIVE DIELECTRIC CONSTANT MATERIALS;
CERAMIC MATERIALS;
COMPUTATIONAL METHODS;
MEASUREMENT ERRORS;
PERMITTIVITY MEASUREMENT;
QUARTZ;
WAVEGUIDES;
DIELECTRIC MATERIALS;
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EID: 0033893949
PISSN: 00189480
EISSN: None
Source Type: Journal
DOI: 10.1109/22.826830 Document Type: Article |
Times cited : (11)
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References (7)
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