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Volumn 48, Issue 3, 2000, Pages 329-333

Method for measuring properties of high relative dielectric constant materials in a cutoff waveguide cavity

Author keywords

[No Author keywords available]

Indexed keywords

CUTOFF WAVEGUIDE CAVITY; HIGH RELATIVE DIELECTRIC CONSTANT MATERIALS;

EID: 0033893949     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.826830     Document Type: Article
Times cited : (11)

References (7)
  • 1
    • 84928809109 scopus 로고
    • A dielectric resonator method of measuring inductive capacities in the millimeter range
    • July
    • B.W. Hakki and P. D. Colemak, "A dielectric resonator method of measuring inductive capacities in the millimeter range," IEEE Trans. Microwave Theory Tech., vol. MTT-8, pp. 402-410, July 1960.
    • (1960) IEEE Trans. Microwave Theory Tech. , vol.MTT-8 , pp. 402-410
    • Hakki, B.W.1    Colemak, P.D.2
  • 2
    • 0014829002 scopus 로고
    • Analyses and evaluation of a method of measuring the complex permittivity and permeability of microwave insulation
    • Aug.
    • W. E. Courtney, "Analyses and evaluation of a method of measuring the complex permittivity and permeability of microwave insulation," IEEE Trans. Microwave Theory Tech, vol. MTT-18, pp. 476-485, Aug. 1970.
    • (1970) IEEE Trans. Microwave Theory Tech , vol.MTT-18 , pp. 476-485
    • Courtney, W.E.1
  • 3
    • 0019071852 scopus 로고
    • Resonant modes of a dielectric rod resonator short-circuited at both ends by parallel conducting plates
    • Oct.
    • Y. Kobayashi and S. Tanaka, "Resonant modes of a dielectric rod resonator short-circuited at both ends by parallel conducting plates," IEEE Trans. Microwave Theory Tech., vol. MTT-28, pp. 1077-1085, Oct. 1980.
    • (1980) IEEE Trans. Microwave Theory Tech. , vol.MTT-28 , pp. 1077-1085
    • Kobayashi, Y.1    Tanaka, S.2
  • 5
    • 79952626988 scopus 로고    scopus 로고
    • Trans-Tech, Adamstown,sti MD
    • Dielectric Resonators, Trans-Tech, Adamstown, MD, 1997.
    • (1997) Dielectric Resonators
  • 6
    • 0022488559 scopus 로고
    • The measurement of the properties of materials
    • Jan.
    • M. N. Afsar, J. R. Birch, and R. N. Clarke, "The measurement of the properties of materials," Proc. IEEE, vol. 74, Jan. 1986.
    • (1986) Proc. IEEE , vol.74
    • Afsar, M.N.1    Birch, J.R.2    Clarke, R.N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.