Parametric investigation of a graphite foam evaporator in a thermosyphon with fluorinert and a silicon CMOS chip

IEEE Transactions on Device and Materials Reliability

Volumn 4, Issue 4, 2004, Pages 626-637

  Klett, James W ^a   Trammell, Michael ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Evaporator; Fluorinert; Graphite foam; Thermosyphon

Indexed keywords

CMOS INTEGRATED CIRCUITS; COOLING; FOAMS; GRAPHITE; HEAT FLUX; PARAMETER ESTIMATION; SOLDERING; THERMAL CONDUCTIVITY OF SOLIDS;

FLUORINETS; SLOTTED PATTERNS; THERMAL PERFORMANCE; THERMOSYPHONS;

EVAPORATORS;

EID: 13444251174     PISSN: 15304388     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDMR.2004.831994     Document Type: Article

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