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Volumn 23, Issue 6, 2003, Pages 52-61

Temperature-aware computer systems: Opportunities and challenges

Author keywords

[No Author keywords available]

Indexed keywords

HEAT DENSITY; THERMAL ENGINEERING;

EID: 1342346134     PISSN: 02721732     EISSN: None     Source Type: Journal    
DOI: 10.1109/MM.2003.1261387     Document Type: Review
Times cited : (97)

References (14)
  • 2
    • 0003815341 scopus 로고    scopus 로고
    • Managing the Impact of Increasing Microprocessor Power Consumption
    • Feb.
    • S. Gunther et al., "Managing the Impact of Increasing Microprocessor Power Consumption," Intel Technology J., Feb. 2001; http://www.intel.com/technology/itj/q12001/articles/art_4.htm.
    • (2001) Intel Technology J.
    • Gunther, S.1
  • 5
    • 0034462496 scopus 로고    scopus 로고
    • A Framework for Dynamic Energy Efficiency and Temperature Management
    • IEEE CS Press
    • W. Huang et al., "A Framework for Dynamic Energy Efficiency and Temperature Management," Proc. 33rd Ann. IEEE/ACM Int'l Symp. Microarchitecture (MICRO-33), IEEE CS Press, 2000, pp. 202-213.
    • (2000) Proc. 33rd Ann. IEEE/ACM Int'l Symp. Microarchitecture (MICRO-33) , pp. 202-213
    • Huang, W.1
  • 9
    • 1142305196 scopus 로고    scopus 로고
    • Predictive Dynamic Thermal Management for Multimedia Applications
    • ACM Press
    • J. Srinivasan and S.V. Adve, "Predictive Dynamic Thermal Management for Multimedia Applications," Proc. 17th Int'l Conf. Supercomputing(ICS 03), ACM Press, 2003, pp. 109-120.
    • (2003) Proc. 17th Int'l Conf. Supercomputing(ICS 03) , pp. 109-120
    • Srinivasan, J.1    Adve, S.V.2
  • 10
    • 1342320042 scopus 로고    scopus 로고
    • Hotspot: A Dynamic Compact Thermal Model at the Processor-Architecture Level
    • Elsevier
    • M.R.Stanetal, "Hotspot: A Dynamic Compact Thermal Model at the Processor-Architecture Level," to be published in Microelectronics J.: Circuits arid Systems, Elsevier, 2003.
    • (2003) Microelectronics J.: Circuits Arid Systems
    • Stanetal, M.R.1
  • 12
    • 0000551402 scopus 로고
    • Constricting/Spreading Resistance Model for Electronics Packaging
    • American Soc. of Mechanical Eng.
    • S. Leeetal, "Constricting/Spreading Resistance Model for Electronics Packaging," Proc. ASME/JSME Thermal Eng. Conf., American Soc. of Mechanical Eng., 1995, pp. 199-206.
    • (1995) Proc. ASME/JSME Thermal Eng. Conf. , pp. 199-206
    • Leeetal, S.1
  • 13
    • 0003352129 scopus 로고    scopus 로고
    • Thermal Performance Challenges from Silicon to Systems
    • Aug.
    • R. Viswanath et al., "Thermal Performance Challenges from Silicon to Systems," Intel Technology J., Aug. 2000; http://www.intel. com/technology/itj/q32000/articles/art_4.htm.
    • (2000) Intel Technology J.
    • Viswanath, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.