The effect of orientation on structure and ferroelectric properties of Bi3.25La0.75Ti3O12 thin films

Surface and Coatings Technology

Volumn 177-178, Issue , 2004, Pages 770-773

  Kim, Kyoung Tae ^a   Kim, Chang Il ^a  

^a Chung Ang University   (South Korea)

Author keywords

BLT; Ferroelectric random access memory; Metalorganic decomposition; Orientation; Thin film

Indexed keywords

BISMUTH ALLOYS; DECOMPOSITION; DEPOSITION; FERROELECTRIC MATERIALS; FILM GROWTH; METALLIC FILMS; MOLECULAR ORIENTATION; ORGANOMETALLICS; POLARIZATION; REMANENCE; SURFACE STRUCTURE; TITANIUM DIOXIDE;

BLT THIN FILMS; REMANENT POLARIZATION;

MAGNETIC THIN FILMS;

COATING;

EID: 1342331889     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2003.08.020     Document Type: Article

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