Correlation of morphology and barrier properties of thin microwave plasma polymer films on metal substrate

Electrochimica Acta

Volumn 49, Issue 12, 2004, Pages 1999-2013

  Barranco, V ^a   Carpentier, J ^a   Grundmeier, G ^a  

^a MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

Author keywords

Barrier; Diffusion; Iron; Morphology; Plasma polymer; Thin film

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION; CORROSION RESISTANCE; CROSSLINKING; DIFFUSION; INFRARED SPECTROSCOPY; MASS SPECTROMETRY; MICROWAVES; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PLASMAS; SECONDARY ION MASS SPECTROMETRY; SPECTROSCOPY; STRUCTURE (COMPOSITION); THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

BARRIERS; PLASMA POLYMERS;

PLASTIC FILMS;

EID: 1342328206     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2003.12.030     Document Type: Article

References (43)

1. N. Morosoff, In: R. d'Agostino (Ed.), Plasma Deposition, Treatment and Etching of Polymers, Academic Press, 1990, Chapter 1, p. 68.
2. Wang T.F., Lin T.J., et al. Prog. Org. Coatings. 28:1996;291.
3. van Ooij W.J., Sabata A., Zeik D.B., Tailor C.E., Boeiro F.J., Clarson S.J. J. Testing Eval. 23:1995;33-40.
4. Yasuda H., Wang T.F., et al. Prog. Org. Coatings. 30:1997;31.
5. Grundmeier G., Stratmann M. Mater. Corrosion. 49:1998;150.
6. Walter G. Corrosion Sci. 32:1991;1085.
7. Beaunier L., Epelboin I., Lestrade J.C., Takenouti H. Surface Technol. 4:1976;237.
8. Mansfeld F., Han L.T., Lee C.C., Zhang G. Electrochim. Acta. 43(19/20):1998;2933.
9. van der Weijde D.H., van Westing E.P.M., de Wit J.H.W. Electrochim. Acta. 41(7/8):1996;1103.
10. Kendig M., Mansfeld F., Tsai S. Corrosion Sci. 23(4):1983;317.
11. Linqvist S.A. Corrosion. 41:1985;69.
12. Deflorian F., Fedrizzi L., Rossi S., Bonora P.L. Electrochim. Acta. 44:1999;4243.
13. Galliano F., Landolt D. Prog. Org. Coatings. 44:2002;217.
14. Deflorian F., Fedrizzi L., Bonora P.L. Corrosion Sci. 38(10):1996;1697.
15. Bonora P.L., Deflorian F., Fedrizzi L. Electrochim. Acta. 41(7/8):1996;1073.
16. Feliu S., Galván J.C., Morcillo M. Prog. Org. Coatings. 172:1989;143.
17. Brasher D.M., Kingsbury A.H. J. Appl. Chem. 4:1954;62.
18. J. Crank, G.S. Park, Diffusion in Polymers, Academic Press, London, 1968.
19. J. Crank, The Mathematics of Diffusion, Oxford University Press, London, 1967.
20. Castela A.S.L., Simões A.M., Ferreira M.G.S. Prog. Org. Coatings. 38:2000;1.
21. Belluci F., Nicodemo L. Corrosion. 49:1993;235.
22. van Westing E.P.M., Ferrari G.M., de Wit J.H.W. Corrosion Sci. 36:1994;957.
23. Liu B., Li Y., Lin H., Cao C.-N. Corrosion Sci. 44:2002;2657.
24. van Ooij W.J., Surman D., Yasuda H.K. Prog. Org. Coatings. 25:1995;319.
25. Klages C.-P., Dietz A., Höing T., Thyen R., Weber A., Willich P. Surface Coatings Tech. 80:1996;121.
26. Vautrin-Ul Ch., Roux F., Boisse-Laporte C., Pastol J.L., Chausse A. J. Mater. Chem. 12:2002;2318.
27. Domingues L., Oliveira C., Fernandes J.C.S., Ferreira M.G.S. Electrochim. Acta. 47:2002;2253.
28. Hossiau L., Bertrand P. Appl. Surf. Sci. 175/176:2001;351.
29. Van Ooij W.J., Sabata A. J. Adhesion Sci. Technol. 5(10):1991;843.
30. Bertrand N., Drévillon B., Bulkin P. J. Vac. Sci. Technol. A16(1):1998;63.
31. Breuer N., Funtikov A.M., Stimming U., Vogel R. Surf. Sci. 335:1995;145.
32. van der Weijde D.H., van Westing E.P.M., de Wit J.H.W. Corrosion Sci. 36(4):1994;643.
33. Corfias C., Pébère N., Lacabanne C. Corrosion Sci. 42:2000;1337.
34. Passiniemi P. Polymer. 36(2):1995;341.
35. J.N. Mure, A.D. Jekinns, Properties of Liquids and Solutions, second ed., Willey, Chichester, England, 1994.
36. Zhou H., et al. Microelectronics J. 33:2002;221.
37. Shiaw-Guang Hu D., Jiunn-Nan Chou K. Polymer. 37(6):1996;1019.
38. Han H., Seo J., Ree M., Pyo S.M., Gryte C.C. Polymer. 39(3):1998;2963.
39. Sutandar P., Ahn D.J., Franses E.I. Macromolecules. 27:1994;7316.
40. Zenasni A., Raynaud P., Sahli S., Rebiai S., Segui Y. Surface Coatings Technol. 174/175:2003;162.
41. Horczynski E. Solid State Technol. 42:1999;43.
42. Pang B., Yau W.-F., Lee P., Naik M. Semicond. Fabtech. 10:1999;7.
43. Duval S. J. Electr. Soc. 149(11):2002;B520.