Direct electrical detection of hybridization at DNA-modified silicon surfaces

Biosensors and Bioelectronics

Volumn 19, Issue 9, 2004, Pages 1013-1019

  Cai, Wei ^a   Peck, John R ^b   Van Der Weide, Daniel W ^b   Hamers, Robert J ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b University of Wisconsin Madison   (United States)

Author keywords

DNA; Electrical detection; Hybridization; Impedance spectroscopy; Sensor; Silicon

Indexed keywords

DNA; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; ELECTROCHEMISTRY; FLUORESCENCE; OLIGOMERS; SILICON; SPECTROSCOPIC ANALYSIS;

HYBRIDIZATION; OLIGONUCLEOTIDES;

BIOSENSORS;

CARBON; DNA; OLIGONUCLEOTIDE; OXIDE; SILICON;

ACCURACY; ARTICLE; COVALENT BOND; DENATURATION; DNA HYBRIDIZATION; DNA MODIFICATION; DNA SEQUENCE; ELECTRIC RESISTANCE; ELECTRICITY; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; FLUORESCENCE; IMPEDANCE; MEASUREMENT; MODEL; MOLECULE; SURFACE PROPERTY;

EID: 1342328089     PISSN: 09565663     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.bios.2003.09.009     Document Type: Article

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