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Volumn 49, Issue 2, 2004, Pages 183-190
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Surface diagnostics for scale analysis
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Author keywords
AFM; Force interactions; Struvite; Surface roughness
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Indexed keywords
ADHESION;
ATOMIC FORCE MICROSCOPY;
POLYMETHYL METHACRYLATES;
POLYTETRAFLUOROETHYLENES;
SILICON CARBIDE;
STAINLESS STEEL;
SURFACE TREATMENT;
FORCE-DISTANCE MICROSCOPY TECHNIQUES;
SCALING;
SCALE (DEPOSITS);
POLITEF;
POLY(METHYL METHACRYLATE);
SILICON CARBIDE;
STAINLESS STEEL;
MATERIAL;
POLYMER;
SCALING;
SURFACE ROUGHNESS;
ADHESION;
ATOMIC FORCE MICROSCOPY;
CONFERENCE PAPER;
ENVIRONMENTAL FACTOR;
FORCE;
MICROSCOPY;
SCREENING;
SURFACE PROPERTY;
SURFACE WATER HYDROLOGY;
TOPOGRAPHY;
WATER TREATMENT;
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EID: 1342326753
PISSN: 02731223
EISSN: None
Source Type: Journal
DOI: 10.2166/wst.2004.0120 Document Type: Conference Paper |
Times cited : (10)
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References (6)
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