Epitaxial growth of LaFeO3 thin films by RF magnetron sputtering

Journal of Crystal Growth

Volumn 263, Issue 1-4, 2004, Pages 436-441

  Lee, Yi Hsien ^a   Wu, Jenn Ming ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

A1. Atomic force microscopy; A1. X ray diffraction; A3. Physical vapor decomposition processes; B1. Oxides; B1. Perovskites; B3. Semiconducting materials

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; MAGNESIA; MAGNETRON SPUTTERING; MOLECULAR ORIENTATION; PEROVSKITE; PHYSICAL VAPOR DEPOSITION; SINGLE CRYSTALS; SURFACE ROUGHNESS; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

LATTICE MISMATCH; RF SPUTTERING;

LANTHANUM COMPOUNDS;

EID: 1342326234     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2003.12.007     Document Type: Article

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