Temperature dependence of electroluminescence degradation in organic light emitting devices without and with a copper phthalocyanine buffer layer

Organic Electronics

Volumn 3, Issue 1, 2002, Pages 9-13

  Dos Anjos, Paulo N M ^a   Aziz, Hany ^a   Hu, Nan Xing ^a   Popovic, Zoran D ^a  

^a XEROX RESEARCH CENTRE OF CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; DEGRADATION; ELECTROLUMINESCENCE; HOLE MOBILITY; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTOR DOPING; THERMAL EFFECTS;

COPPER PHTHALOCYANINE; HOLE INJECTION; HOLE TRANSPORT LAYER (HTL); ORGANIC LIGHT EMITTING DEVICES (OLED); TEMPERATURE DEPENDENCE;

LIGHT EMITTING DIODES;

EID: 1342318187     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1566-1199(01)00025-8     Document Type: Article

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