Metric 3D reconstruction and texture acquisition of surfaces of revolution from a single uncalibrated view

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 27, Issue 1, 2005, Pages 99-114

  Colombo, Carlo ^a   Del Bimbo, Alberto ^a   Pernici, Federico ^a  

^a UNIVERSITY OF FLORENCE   (Italy)

Author keywords

Camera self calibration; Image based modeling; Projective geometry; Single view 3D metric reconstruction; Surface of revolution; Texture acquisition

Indexed keywords

CALIBRATION; CAMERAS; COMPUTATIONAL GEOMETRY; COMPUTER VISION; IMAGE ANALYSIS; NONLINEAR EQUATIONS; PARAMETER ESTIMATION;

CAMERA SELF CALIBRATION; IMAGE BASED MODELING; METRIC RECONSTRUCTION; PROJECTIVE GEOMETRY; SURFACE-OF-REVOLUTION; TEXTURE ACQUISITION;

IMAGE RECONSTRUCTION;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; CALIBRATION; CLUSTER ANALYSIS; COMPARATIVE STUDY; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; EVALUATION; IMAGE ENHANCEMENT; IMAGE SUBTRACTION; INFORMATION RETRIEVAL; MATHEMATICAL COMPUTING; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING; THREE DIMENSIONAL IMAGING; VALIDATION STUDY;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; CALIBRATION; CLUSTER ANALYSIS; COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; INFORMATION STORAGE AND RETRIEVAL; NUMERICAL ANALYSIS, COMPUTER-ASSISTED; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED; SUBTRACTION TECHNIQUE;

EID: 13344280991     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2005.14     Document Type: Article

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