Reuse of imputed data in microarray analysis increases imputation efficiency

BMC Bioinformatics

Volumn 5, Issue , 2004, Pages

  Kim, Ki Yeol ^a   Kim, Byoung Jin ^a   Yi, Gwan Su ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DNA MICROARRAY DATA; EXPECTATION MAXIMIZATION; IMPUTATION OF MISSING VALUES; K-NEAREST NEIGHBORS; MICROARRAY ANALYSIS; MICROARRAY EXPERIMENTS; MULTIPLE IMPUTATION; NUMBER OF ITERATIONS;

CLUSTERING ALGORITHMS; EXPERIMENTS; MAXIMUM LIKELIHOOD ESTIMATION;

EFFICIENCY;

ACCURACY; ARTICLE; CLUSTER ANALYSIS; DNA MICROARRAY; GENE CLUSTER; INFORMATION PROCESSING; MATHEMATICAL COMPUTING; MAXIMUM LIKELIHOOD METHOD; PROCESS DEVELOPMENT; SEQUENTIAL K NEAREST NEIGHBOR; STATISTICAL ANALYSIS; STATISTICAL MODEL; EVALUATION STUDY; MICROARRAY ANALYSIS; ORGANIZATION AND MANAGEMENT; PROCEDURES; STANDARDS;

EFFICIENCY, ORGANIZATIONAL; MICROARRAY ANALYSIS;

EID: 13244298228     PISSN: 14712105     EISSN: None     Source Type: Journal    
DOI: 10.1186/1471-2105-5-160     Document Type: Article

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