Uncertainty of ADC random noise estimates obtained with the IEEE 1057 standard test

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 1, 2005, Pages 110-116

  Alegria, Francisco André Corrêa ^a   Da Cruz Serra, António Manuel ^a  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

Analog to digital converter (ADC) testing; Random noise; Uncertainty

Indexed keywords

APPROXIMATION THEORY; ELECTRIC POTENTIAL; ESTIMATION; INSTRUMENT TESTING; PROBABILITY DISTRIBUTIONS; SPURIOUS SIGNAL NOISE; WAVEFORM ANALYSIS;

ANALOG TO DIGITAL CONVERTER TESTING; RANDOM NOISE;

ANALOG TO DIGITAL CONVERSION;

EID: 13244296896     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.840226     Document Type: Article

References (9)

1. IEEE Standard for Digitizing Waveform Recorders - IEEE Std. 1057-1994 SH94245, Dec. 1994.
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8. F. C. Alegria and A. C. Serra, "On the IEEE 1057 standard random noise test of ADCs," IEEE Trans. Instrum. Meas., submitted for publication.
9. A. Papoulis, Probability, Random Variables and Stochastic Processes 3rd ed. New York: McGraw-Hill, 1991.