Selecting test frequencies for sinewave tests of ADCs

IEEE Transactions on Instrumentation and Measurement

Volumn 54, Issue 1, 2005, Pages 73-78

  Blair, Jerome J ^a  

^a BECHTEL CORPORATION   (United States)

Author keywords

Analog to digital converter (ADC); Frequency; Sinewave test; Waveform recorder

Indexed keywords

ALGORITHMS; ANALOG TO DIGITAL CONVERSION; ERROR ANALYSIS; FREQUENCY MODULATION; JITTER;

SINEWAVE TEST; WAVEFORM RECORDER;

WAVEFORM ANALYSIS;

EID: 13244295619     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2004.838913     Document Type: Article

References (6)

1. IEEE Standard for Digitizing Waveform Recorders, IEEE Stand. 1057-1994, Dec. 1994.
2. IEEE Standard Terminology and Test Methods for Analog-to-Digital Converters, IEEE Stand. 1241-2000, Jun. 2001.
3. J. Blair, "Histogram measurement of ADC nonlinearities using sine waves," IEEE Trans. Instrum. Meas., vol. 43, pp. 373-383, June 1994.
4. P. Carbone and G. Chiorboli, "ADC sinewave histogram testing with quasi-coherent sampling," IEEE Trans. Instrum. Meas., vol. 50, pp. 949-953, Aug. 2001.
5. F. C. Alegria and A. C. Serra, "Variance of the cumulative histogram of ADCs due to frequency errors," in Proc. 18th IEEE IMTC Conf., vol. 3, pp. 2021-2026.
6. The Mathworks. MATLAB Software for Sinewave Testing [Online] Available: http://www.mit.bme.hu/services/ieee/ADC-test/