How the size of a particle approaching dielectric interface influences its behavior

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5514, Issue , 2004, Pages 636-642

  Jákl, Petr ^a   Šerý, Mojmír ^a   Ježek, Jan ^a   Zemánek, Pavel ^a  

^a INSTITUTE OF SCIENTIFIC INSTRUMENTS   (Czech Republic)

Author keywords

Optical tweezers; Particle position detection; Standing wave; Two photon fluorescence

Indexed keywords

DIELECTRIC MATERIALS; FABRICATION; FLUORESCENCE; INTERFACES (MATERIALS); LIGHT REFLECTION; MICROSCOPIC EXAMINATION; MIRRORS; PARTICLES (PARTICULATE MATTER); PHOTOMULTIPLIERS; STANDING WAVE METERS;

OTPICAL TWEEZERS; PARTICLE POSITION DETECTION; STANDING WAVES; TWO-PHOTON FLUORESCENCE;

OPTICAL DEVICES;

EID: 13244295422     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.557189     Document Type: Conference Paper

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