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Volumn 50, Issue 10, 2003, Pages 1615-1625

Behaviour of an optically trapped probe approaching a dielectric interface

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC MATERIALS; LASER BEAMS; LIGHT REFLECTION; PROBES;

EID: 1542336994     PISSN: 09500340     EISSN: None     Source Type: Journal    
DOI: 10.1080/0950034031000069451     Document Type: Article
Times cited : (24)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.