Synthesis and characterization of surface-initiated polymer brush prepared by reverse atom transfer radical polymerization

European Polymer Journal

Volumn 41, Issue 4, 2005, Pages 737-741

  Wang, Yun Pu ^a   Pei, Xiao Wei ^a   He, Xiao Yan ^a   Lei, Zi Qiang ^a  

^a NORTHWEST NORMAL UNIVERSITY   (China)

Author keywords

Polymer brushes; Reverse ATRP; Silicon wafer; Surface initiated; Synthesis

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATALYSTS; CONTACT ANGLE; DEGASSING; ELLIPSOMETRY; NANOSTRUCTURED MATERIALS; POLYMERIZATION; REACTION KINETICS; SILICON WAFERS; SURFACE TREATMENT; SYNTHESIS (CHEMICAL); ULTRASONIC TESTING; X RAY PHOTOELECTRON SPECTROSCOPY;

GRAFTLAYER THICKNESS; POLYMER BRUSHES; REVERSE ATOM TRANSFER RADIAL POLYMERIZATION (ATRP); SURFACE-INITIATED;

POLYMERS;

EID: 13244264998     PISSN: 00143057     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.eurpolymj.2004.11.009     Document Type: Article

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