Direct evaluation of self-absorption effects in dark matrices by Compton scattering measurements

X-Ray Spectrometry

Volumn 29, Issue 6, 2000, Pages 443-448

  Bonizzoni, L ^a   Galli, A ^a   Milazzo, M ^a  

^a Ist di Fisica Generale Applicata   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CHEMICAL ELEMENTS; COMPTON SCATTERING; ENERGY DISPERSIVE SPECTROSCOPY; FLUORESCENCE; GLASS; ITERATIVE METHODS;

DARK MATRIXES; DIRECT EVALUATIONS; ELEMENT MATRIX; ENERGY-DISPERSIVE X-RAY FLUORESCENCE ANALYSIS; GLASS-CERAMICS; LIGHT ELEMENTS; MATRIX PROBLEM; NON DESTRUCTIVE; SCATTERING MEASUREMENTS; SELF-ABSORPTION EFFECTS;

NUMERICAL METHODS;

EID: 0034367156     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/1097-4539(200011/12)29:6<443::AID-XRS451>3.0.CO;2-B     Document Type: Article

References (12)

1. Nielson KK. Anal. Chem. 1997; 49: 641.
2. Willis P. Adv. X-Ray Anal. 1991; 34: 243.
3. Van Sprang A, Bekkers MHJ. X-Ray Spectrom 1998; 27: 1.
4. He F, Van Espen P. Nucl. Instrum. Methods 1990; 299: 580.
5. Van Espen P, Janssens K, Swenters I. Manual for AXIL Software. Canberra-Packard: Antwerp, 1994.
6. Knoll KF. Radiation Detection and Measurement. John Wiley & Sons: New York, 1989.
7. Bui C, Confalonier L, Milazzo M. J. Radiat. Isot. 1989; 5: 375.
8. Reynolds C. Am. Mineral. 1967; 52: 1493.
9. Berger J, Hubble JH. XCOM: Photon Cross Sections Database, NIST Standard Reference Database 8 (XGAM), NBSIR 87-3597. NIST: Gaithersbury, MD, 1999.
10. Lachance R, Claisse F. Quantitative X-Ray Fluorescence Analysis, John Wiley & Sons: New York, 1995.
11. Vekemans B, Janssens K, Vincze L, Adams F, Van Espen P. X-Rax Spectrom. 1994; 23: 6.
12. Bonizzoni L, Cicardi C, De Martinis C, Galli A, Milazzo M. INFN/TC-99/08, Development of an x-ray spectrometer for high lateral resolution XRF analysis. SIS-Pubblicationi Laboratori National di Frascati, 1999.