Single-layer-coated beam splitters for the division-of-amplitude photopolarimeter

Applied Optics

Volumn 44, Issue 2, 2005, Pages 190-196

  Azzam, Rasheed M A ^a   Sudradjat, Faisal F ^a  

^a UNO College of Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; MONOCHROMATORS; POLARIMETERS; PRISMS; PRODUCT DESIGN; REFLECTIVE COATINGS; REFRACTIVE INDEX; SUBSTRATES; VECTORS;

BEAM SPLITTERS; PHOTOPOLARIMETERS; SINGLE-LAYERED-COATED BEAM SPLITTERS; WOLLASTON PRISMS;

LIGHT;

EID: 12844281790     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.000190     Document Type: Article

References (16)

1. R. M. A. Azzam, "Ellipsometry," in Handbook of Optics, 2nd ed., M. Bass, E. W. van Stryland, D. R. Williams, and W. L. Wolfe, eds. (McGraw-Hill, New York, 1995), Vol. II, Chap. 27.
2. R. A. Chipman, "Polarimetry," in Handbook of Optics, 2nd ed., M. Bass, E. W. van Stryland, D. R. Williams, and W. L. Wolfe, eds. (McGraw-Hill, New York, 1995), Vol. II, Chap. 22.
3. P. S. Hauge, "Recent developments in instrumentation in ellipsometry," Surf. Sci. 96, 108-140 (1980).
4. R. M. A. Azzam, "Division-of-amplitude photopolarimeter (DOAP) for the simultaneous measurement of all four Stokes parameters of light," Opt. Acta 29, 685-689 (1982).
5. R. M. A. Azzam, "Beam splitters for the division-of-amplitude photopolarimeter," Opt. Acta 32, 1407-1412 (1985).
6. R. M. A. Azzam and A. G. Lopez, "Accurate calibration of the four-detector photopolarimeter with imperfect polarizing optical elements," J. Opt. Soc. Am. A 6, 1513-1521 (1989).
7. K. Brudzewski, "Static Stokes ellipsometer: general analysis," J. Mod. Opt. 38, 889-896 (1991).
8. S. Krishnan, "Calibration, properties, and applications of the division-of-amplitude photopolarimeter at 632.8 and 1523 nm," J. Opt. Soc. Am. A 9, 1615-1622 (1992).
9. F. Delplancke, "Automated high-speed Mueller matrix scatterometer," Appl. Opt. 36, 5388-5395 (1997).
10. E. Compain and B. Drevillon, "Broadband division-of-amplitude polarimeter based on uncoated prisms," Appl. Opt. 37, 5938-5946 (1998).
11. R. M. A. Azzam, "Recent developments of division-of-amplitude photopolarimeters," in Proceedings of the Interna-tional Symposium on Polarization Analysis and Applications to Device Technology, T. Yoshizawa and H. Yokota, eds., Proc. SPIE 2873, 1-4 (1996).
12. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1987).
13. R. M. A. Azzam and A. De, "Optimal beam splitters for the division-of-amplitude photopolarimeter," J. Opt. Soc. Am. A 20, 955-958 (2003).
14. W. L. Wolfe, "Properties of optical materials," in Handbook of Optics, W. D. Driscoll and W. Vaughan, eds. (McGraw-Hill, New York, 1978), See. 7.
15. W. J. Tropf, M. T. Thomas, and T. J. Harris, "Properties of crystals and glasses," in Handbook of Optics, M. Bass, E. W. van Stryland, D. R. Williams, and W. L. Wolfe, eds. (McGraw-Hill, New York, 1995), Vol. II, Chap. 33.
16. G. Eisenstein and L. W. Stulz, "High quality antireflection coatings on laser facets by sputtered silicon nitride," Appl. Opt. 23, 161-164 (1984).