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Volumn 228, Issue 1-2 SPEC. ISS., 2005, Pages 145-150
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Materials characterization by X-ray photoelectron spectroscopy
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Author keywords
Materials characterization; Photoelectron; Surface analysis; XPS
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Indexed keywords
CATALYSIS;
CHARACTERIZATION;
ELECTRON ENERGY LEVELS;
GROWTH (MATERIALS);
SEGREGATION (METALLOGRAPHY);
SURFACE CHEMISTRY;
THIN FILMS;
TRIBOLOGY;
MATERIALS CHARACTERIZATION;
MEAN FREE PATH;
SURFACE ANALYSIS;
THIN METALLIC FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
METAL;
OXIDE;
ANALYTIC METHOD;
ATOM;
CATALYSIS;
CONFERENCE PAPER;
CORROSION;
ELECTRON;
FILM;
MOLECULAR PROBE;
PHYSICAL CHEMISTRY;
SOLID;
SURFACE PROPERTY;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 12844281297
PISSN: 13811169
EISSN: None
Source Type: Journal
DOI: 10.1016/j.molcata.2004.09.075 Document Type: Conference Paper |
Times cited : (21)
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References (14)
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