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Volumn 228, Issue 1-2 SPEC. ISS., 2005, Pages 145-150

Materials characterization by X-ray photoelectron spectroscopy

Author keywords

Materials characterization; Photoelectron; Surface analysis; XPS

Indexed keywords

CATALYSIS; CHARACTERIZATION; ELECTRON ENERGY LEVELS; GROWTH (MATERIALS); SEGREGATION (METALLOGRAPHY); SURFACE CHEMISTRY; THIN FILMS; TRIBOLOGY;

EID: 12844281297     PISSN: 13811169     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.molcata.2004.09.075     Document Type: Conference Paper
Times cited : (21)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.