XPS and atomic force microscopy analyses of thin Au and Cu films on Pd

Surface and Interface Analysis

Volumn 36, Issue 8, 2004, Pages 931-934

  Maluf, S S ^a   Gobbi, A L ^b   Paulin Filho, P I ^a   Nascente, P A P ^a  

^a FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

^b LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

Author keywords

AFM; Copper; Gold; Palladium; Thin film; XPS

Indexed keywords

ALLOY FORMATION; BIMETALLIC SYSTEMS; DIGITAL NANOSCOPE; ELECTRONIC STRUCTURES;

ATOMIC FORCE MICROSCOPY; BIMETALS; CHEMICAL ANALYSIS; COPPER; COPPER OXIDES; GOLD; MORPHOLOGY; PALLADIUM; POLYCRYSTALLINE MATERIALS; SPUTTERING; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

THIN FILMS;

EID: 4444240060     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1803     Document Type: Conference Paper

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