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Volumn 818, Issue , 2004, Pages 47-52

Nucleation and growth of gold nanoparticles deposited by RF-sputtering: An experimental study

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; ATOMIC FORCE MICROSCOPY; GRAPHITE; NANOSTRUCTURED MATERIALS; NUCLEATION; PLASMAS; SCANNING TUNNELING MICROSCOPY; SILICA; SILICON; SPUTTER DEPOSITION; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 12844258267     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-818-m3.7.1     Document Type: Conference Paper
Times cited : (2)

References (19)
  • 10
    • 0035761325 scopus 로고    scopus 로고
    • Optical Metrology, Roadmap for the Semiconductor, Optical, and Data Storage Industries, ed. A. Duparrè and B. Singh
    • J. H. Kim, S. H. Ehrman, G. W. Mulholland, and T. A. Germer in Optical Metrology, Roadmap for the Semiconductor, Optical, and Data Storage Industries, ed. A. Duparrè and B. Singh, (Proc. SPIE 4449, 2001), p. 281.
    • (2001) Proc. SPIE , vol.4449 , pp. 281
    • Kim, J.H.1    Ehrman, S.H.2    Mulholland, G.W.3    Germer, T.A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.