Structural investigations on ferroelectric Pb1-3/2xLa xTiO3 using the x-ray Rietveld method

Journal of Materials Research

Volumn 19, Issue 12, 2004, Pages 3614-3619

  Chen, Jun ^a   Xing, Xianran ^a   Yu, Ranbo ^a   Liu, Guirong ^a   Wu, Li ^b   Chen, Xiaolong ^b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

^b INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CRYSTALLINE MATERIALS; DEFECTS; FERROELECTRIC MATERIALS; LANTHANUM; PEROVSKITE; PHASE COMPOSITION; POLARIZATION; SOLUBILITY; STRAIN; STRUCTURE (COMPOSITION); X RAY DIFFRACTION ANALYSIS;

COMPOSITIONAL INHOMOGENEITY; DIFFRACTION LINE BROADENING; SOLID STATE METHOD; SPONTANEOUS POLARIZATION; STRUCTURAL INVESTIGATIONS; X RAY RIETVELD METHOD;

LEAD COMPOUNDS;

EID: 12844256965     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2004.0463     Document Type: Article

References (22)

1. K. Ijima, R. Takayama, Y. Tomita, and I. Ueda: Epitaxial growth and the crystallographic, dielectric, and pyroelectric properties of lanthanum-modified lead titanate thin films. J. Appl. Phys. 60, 2914 (1986).
2. A.R. Khan and S.B. Desu: The effect of stoichiometry on the microstructure and properties of lead lanthanum titanate thin films. J. Mater. Res. 10, 2777 (1995).
3. D. Hennings and G. Rosenstein: X-ray structure investigation of lanthanum modified lead titanate with A-site and B-site vacancies. Mater. Res. Bull. 7, 1505 (1972).
4. K. Keizer, G.J. Lansink, and A.J. Burggraaf: Anomalous dielectric behaviour of La(III) substituted lead titanate ceramics. J. Phys. Chem. Solids 39, 59 (1978).
5. E.C.S. Tavares, P.S. Pizani, and J.A. Eiras: Short-range disorder in lanthanum-doped lead titanate ceramics probed by Raman scattering. Appl. Phys. Lett. 72, 897 (1998).
6. 3 thin films. Appl. Phys. Lett. 80, 3997 (2002).
7. 3. Appl. Phys. Lett. 77, 3824 (2000).
8. J. Chen, X.R. Xing, R.B. Yu, and J.X. Deng: Thermal expansion properties of lanthanum-substituted lead titanate ceramics. J. Am. Ceram. Soc. (2004) (submitted).
9. 3. J. Alloys Comp. 372, 259 (2004 ).
10. R. Tickoo, R.P. Tandon, N.C. Mehra, and P.N. Kotru: Dielectric and ferroelectric properties of lanthanum modified lead titanate ceramics. Mater. Sci. Eng. B 94, 1 (2002).
11. H.M. Rietveld: A profile refinement method for nuclear and magnetic structures. J. Appl. Crystallogr. 2, 65 (1969).
12. 3 nanocrystals prepared by hydrothermal technique. Mater. Sci. Eng. B 84, 248 (2001).
13. J. Rodriguez-Carjaval: "FULLPROF: A Program for Rietveld Refinement and Pattern Matching Analysis," Abstracts of the Satellite Meeting on Powder Diffraction of the XVth Congress International Union of Crystallography Toulouse, France. (1990), p. 127.
14. T. Yamamoto, H. Igarashi, and K. Okazaki: Dielectric, electromechanical, optical, and mechanical properties of lanthanum-modified lead titanate ceramics. J. Am. Ceram. Soc. 66, 363 (1983).
15. G.A. Rossetti, Jr., L.E. Cross, and J.P. Cline: Structural aspects of the ferroelectric phase transition in lanthanum-substituted lead titanate. J. Mater. Sci. 30, 24 (1995).
16. 3. Acta Crystallogr. 9, 131 (1956).
17. P.W. Stephens: Phenomenological model of anisotropic peak broadening in powder diffraction. J. Appl. Crystallogr. 32, 281 (1999).
18. 3 between 10 and 1023 K. J. Appl. Phys. 77, 1683 (1995).
19. 4/3 por refinamento pelo Metodo de Rietveld. Ceramica 36, 17 (1989 ).
20. 3 thin films. Appl. Phys. Lett. 72, 299 (1998).
21. R.E. Cohen: Origin of ferroelectricity in perovskite oxides. Nature 258, 136 (1992).
22. 0.433. J. Appl. Crystallogr. 37, 123 (2004).