Effects of electric fields as a function of depth in a smectic film

Molecular Crystals and Liquid Crystals

Volumn 412, Issue , 2004, Pages

  Misra, T K ^a   Martinez Miranda L J ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Depth analysis; Effects of electric; Field; Grazing incidence X ray diffraction; Interface interaction; Interface structure

Indexed keywords

DEPTH ANALYSIS; EFFECTS OF ELECTRIC FIELDS; GRAZING INCIDENCE X-RAY DIFFRACTION; INTERFACE INTERACTION; INTERFACE STRUCTURES;

COATINGS; ELECTRIC POTENTIAL; PHOTOLITHOGRAPHY; RELIABILITY; SMECTIC LIQUID CRYSTALS; VECTORS; X RAY DIFFRACTION; X RAY SCATTERING;

ELECTRIC FIELDS;

EID: 12844251360     PISSN: 15421406     EISSN: None     Source Type: Journal    
DOI: 10.1080/15421400490431796     Document Type: Conference Paper

References (6)

1. Patel, J. (1994). Phys. Rev., E, 49, R3594.
2. Misra, T. K. (1998). Depth Dependence Study of the Orientation Effects of an Applied Dr. Electric Field on Smectic Liquid Crystal Films, M. S. Thesis, University of Maryland, College Park.
3. Toner, M. F., Huang, T. G., Brennan, S., & Rek, Z. (1988). J. Mater. Res., 3, 351; Martínez-Miranda, L. J., Hu, Y. & Misra, T. (1999). Mol. Cryst. Liq. Cryst., 329, 121.
4. Toner, M. F., Huang, T. G., Brennan, S., & Rek, Z. (1988). J. Mater. Res., 3, 351; Martínez-Miranda, L. J., Hu, Y. & Misra, T. (1999). Mol. Cryst. Liq. Cryst., 329, 121.
5. Martínez-Miranda, L. J. (2002), J. Appl. Phys., 91, 6452.
6. Martínez-Miranda, L. J., Shi, Y., & Kumar, S. (1999). Molec. Cryst. Liq. Cryst., 326, 41.