X-ray depth profiling of iron oxide thin films

Journal of Materials Research

Volumn 3, Issue 2, 1988, Pages 351-356

  Toney, Michael F ^a   Huang, Ting C ^a   Brennan, Sean ^b   Rek, Zophia ^b  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001063309     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/JMR.1988.0351     Document Type: Article

References (18)

1. S. Yoshii, O. Ishii, S. Hattori, T. Nakagawa, and G. Ishida, J. Appl. Phys. 53, 2556(1982).
2. Y. Ishii, A. Terada, I. Ishii, S. Ohta, S. Hattori, and K. Makino, IEEE Trans. Mag. MAG-16, 1114 (1980).
3. A. Terada, I. Ishii, and S. Ohta, IEEE Trans. Mag. MAG-21, 521 (1985).
4. M. Hansen, Constitution of Binary Alloys (McGraw-Hill, New York, 1958), p. 687.
5. M. M. Chen, C. Ortiz, G. Lim, R. Sigsbee, and G. Castilo, IEEE Trans. Mag. MAG-23, 3423 (1987).
6. S. S. P. Parkin, R. Sigsbee, R. Felici, and G. P. Felcher, Appl. Phys. Lett. 48, 604(1986).
7. E. Kay, R. Sigsbee, G. L. Bona, M. Taborelli, and H. C. Siegmann, Appl. Phys. Lett. 47, 533 (1986).
8. T. C. Huang, M. F. Toney, S. Brennan, and Z. Rek, Thin Solid Films 154,439 (1987).
9. B. Hermsmejer, C. R. Brundle, and J. J. Baglin, J. Vac. Sci. Technol. A 5, 2864 (1987).
10. C. R. Brundle and V. D. Deline (private communication).
11. T. C. Huang and B. R. York, Appl. Phys. Lett. 50, 389 (1987).
12. S. Brennan, Surface Sci. 152/153, 1 (1985).
13. J. Bohr, R. Feidenhans'l, M. Nielsen, M. Toney, R. Johnson, and I. Robinson, Phys. Rev. Lett. 54, 1275 (1985).
14. W. Marra, P. Fuoss, and P. Eisenberger, Phys. Rev. Lett. 49, 1169 (1982).
15. W. Marra, P. Eisenberger, and A. Cho, J. Appl. Phys. 50, 6927 (1979).
16. M. F. Doerner and S. Brennan, J. Appl. Phys. 63, 126 (1988).
17. G. H. Vineyard, Phys. Rev. B 26, 4146 (1982).
18. M. Born and E. Wolf, Principles of Optics (Pergamon, Oxford, 1980).