Wafer-scale scientific CCDs at Fairchild Imaging

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5499, Issue , 2004, Pages 250-257

  Vu, Paul ^a   Onishi, Steve ^a   Potter, Robert ^a  

^a Fairchild Imaging   (United States)

Author keywords

Back illuminated CCD; Large format scientific grade CCD; Wafer scale

Indexed keywords

ARRAYS; CHARGE COUPLED DEVICES; ILLUMINATING ENGINEERING; IMAGE SENSORS; SILICON WAFERS; X RAY DIFFRACTION ANALYSIS;

BACK-ILLUMINATED CCD; FAIRCHILD IMAGING; LARGE FORMAT SCIENTIFIC GRADE CCD; WAFER-SCALE;

IMAGING TECHNIQUES;

EID: 12744281231     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.562492     Document Type: Conference Paper

References (5)

1. M. Lesser, P. Vu, Processing of Back-Illuminated 4096×4096 Fairchild CCDs at the University of Arizona, Proc. SPIE 4306-196, 2001.
2. T.A. Thomson, et al., Advances in CCD technology for x-ray diffraction applications, Proc. SPIE 5198-26, 2003.
3. Bruce Matthews, Ultrahigh-resolution electro-optical framing camera for reconnaissance and other applications using a 9216×9216 pixel wafer-scale focal plane array, Proc SPIE 3431-39, 1998.
4. J. R. Janesick, Scientific charge-coupled devices, Bellingham: SPIE Press, 2001.
5. J.C. Blades, Ultraviolet and Visible Detectors for Future Space Astrophysics Missions: A Report from the Ad-hoc, UV-Visible Detectors Working Group of NASA's Office of Space Science, Washington D.C: Office of Space Science, NASA, Baltimore, Md: Space Telescope Science Institute, 2002.