Annealing-temperature effect on various cutoff-voltage electrochemical performances in AlPO4-nanoparticle-coated LiCoO2

Journal of the Electrochemical Society

Volumn 152, Issue 1, 2005, Pages

  Cho, Jaephil ^a   Kim, Byoungsoo ^b   Lee, Joon Gon ^b   Kim, Young Woon ^b   Park, Byungwoo ^b  

^a Kumoh National Institute of Technology   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIFFUSION; DISSOLUTION; ELECTRIC POTENTIAL; EMISSION SPECTROSCOPY; INDUCTIVELY COUPLED PLASMA; LATTICE CONSTANTS; LITHIUM COMPOUNDS; NANOSTRUCTURED MATERIALS; THERMAL EFFECTS; THERMODYNAMIC STABILITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

ANNEALING TEMPERATURE; CHARGE-CUTOFF VOLTGAGE; ELECTROCHEMICAL PROPERTIES; STRUCTURAL DEGRADATION;

ELECTROCHEMICAL ELECTRODES;

EID: 12744269353     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1825387     Document Type: Article

References (29)

1. H. Wang, Y.-I. Jang, B. Huang, D. R. Sadoway, and Y.-M. Chiang, J. Eleatrochem. Soc., 146, 473 (1999).
2. E. Plichta, S. Slane, M. Uchiyama, M. Salomon, D. Chua, W. B. Ebner, and H. W. Lin, J. Electrochem. Soc., 136, 1865 (1989).
3. H. Tukamoto and A. R. West, J. Electrochem. Soc., 144, 3164 (1997).
4. Y.-I. Jang, B. Huang, H. Wang, D. R. Sadoway, G. Ceder, Y.-M. Chiang, H. Liu, and H. Tamura, J. Electrochem. Soc., 146, 862 (1999).
5. J. Cho, Y. J. Kim, T.-J. Kim, and B. Park, Angew. Chem., Int. Ed. Engl., 40, 3367 (2001).
6. J. Cho, Y. J. Kim, and B. Park, Chem. Mater., 12, 3788 (2000).
7. J. Cho, Y. J. Kim, and B. Park, J. Electrochem. Soc., 148, A1110 (2001).
8. J. Cho, T.-J. Kim, Y. J. Kim, and B. Park Electrochem. Solid-State Lett., 4. A159 (2001).
9. Y. J. Kim, H. Kim, B. Kim, D. Ahn, J.-G. Lee, T.-J. Kim, D. Son, J. Cho, Y.-W. Kim, and B. Park, Chem. Hour., 15, 1505 (2003).
10. A. M. Kannan, L. Rabenberg, and A. Manthiram, Electrochem. Solid-State Lett., 6, A16 (2003).
11. Z. Chen and J. R. Dahn, Electrochem. Solid-State Lett., 5, A213 (2002).
12. Z. Chen and J. R. Dahn, Electrochem. Solid-State Lett., 7, A11 (2004).
13. Z. Chen and J. R. Dahn, Electrochim. Acta, 49, 1079 (2004).
14. J. R. Dahn, E. W. Fuller, M. Obrovac, and U. von Sacken, Solid State Ionics, 69, 265 (1994).
15. D. D. MacNeil, L. Christensen, J. Landucci, J. M. Paulsen, and J. R. Dahn, J. Electrochem. Soc., 147, 970 (2000).
16. C. W. Lee, R. Venkatachalapathy, and J. Prakash, Electrochem. Solid-State Lett., 3, 63 (2000).
17. J. Cho, Y.-W. Kim, B. Kim, J.-G. Lee, and B. Park, Angew. Chem., Int. Ed. Engl., 42, 1618 (2003).
18. J. Cho, J.-G. Lee, B. Kim, and B. Park, Chem. Mater., 15, 3190 (2003).
19. J. Cho, Electrochem. Commun., 5, 146 (2003).
20. P. Birke, W. F. Chu, and W. Weppner, Solid State Ionics, 93, 1 (1997).
21. Y.-M. Choi, S.-I. Pyun, J.-S. Bae, and S.-I. Moon, J. Power Sources, 56, 25 (1995).
22. A. Van der Ven, M. K. Aydinol, G. Ceder, G. Kresse, and J. Hafner, Phys. Rev. B, 58, 2975 (1998).
23. A. Van der Ven, M. K. Aydinol, and G. Ceder, J. Electrochem. Soc., 145, 2149 (1998).
24. Z. Chen, Z. Lu, and J. R. Dahn, J. Electrochem. Soc., 149, A1604 (2002).
25. J. Cho, J.-G. Lee, B. Kim, J. Kim, and B. Park, Electrochim. Acta, Submitted.
26. G. G. Amatucci, J.-M. Tarascon, and L. C. Klein, J. Electrochem. Soc., 143, 1114 (1996).
27. G. G. Amatucci, J.-M. Tarascon, and L. C. Klein, Solid State Ionics, 83, 167 (1996).
28. Y. Kim, J. Oh, T.-G. Kim, and B. Park, Appl. Phys. Lett., 78, 2363 (2001).
29. B. Kim, J.-G. Lee, M. Choi, J. Cho, and B. Park, J. Power Sources, 126, 190 (2004).