Methods to obtain excellent capacity retention in LiCoO2 cycled to 4.5 V

Electrochimica Acta

Volumn 49, Issue 7, 2004, Pages 1079-1090

  Chen, Zhaohui ^a   Dahn, J R ^a  

^a DALHOUSIE UNIVERSITY   (Canada)

Author keywords

Coating; High capacity; LiCoO2; Phase diagram; Staging

Indexed keywords

COATINGS; ELASTIC MODULI; ELECTRIC BATTERIES; ELECTRIC IMPEDANCE; ELECTROLYTES; FRACTURE TOUGHNESS; OXIDES; PHASE DIAGRAMS; PHASE TRANSITIONS; THERMODYNAMIC STABILITY; X RAY DIFFRACTION;

HIGH CAPACITY; LICOO2; STAGING;

LITHIUM COMPOUNDS;

EID: 0942299399     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2003.10.019     Document Type: Article

References (29)

1. Wang H., Jang Y., Huang B., Sadoway D.R., Chang Y. J. Electrochem. Soc. 146(2):1999;473.
2. Cho J., Kim G. Electrochem. Solid-State Lett. 2(6):1999;253.
3. Cho J., Kim C., Yoo S.I. Electrochem. Solid-State Lett. 3(8):2000;362.
4. Cho J., Kim Y.J., Park B. Chem. Mater. 12(12):2000;3788.
5. Cho J., Kim Y.J., Park B. J. Electrochem. Soc. 148(10):2001;A1110.
6. Cho J., Kim Y.J., Kim J.T., Park B. Angew. Chem. Int. Ed. 40(18):2001;3367.
7. Wang Z., Wu C., Liu L., Chen L., Huang X. Solid State Ionics. 148:2002;335.
8. Wang Z., Wu C., Liu L., Wu F., Chen L., Huang X. J. Electrochem. Soc. 149(4):2002;A466.
9. Liu L., Wang Z., Li H., Chen L., Huang X. Electrochem. Solid State Ionics. 152:2002;341.
10. Kannan A.M., Rabenberg L., Manthiram A. Electrochem. Solid-State Lett. 7(1):2002;A16.
11. Reimers J.N., Dahn J.R. J. Electrochem. Soc. 139(8):1992;2091.
12. Lu Z.H., MacNeil D.D., Dahn J.R. Electrochem. Solid-State Lett. 4(11):2001;A191.
13. MacNeil D.D., Lu Z., Dahn J.R. J. Electrochem. Soc. 149(10):2002;A1332.
14. Ohzuku T., Makimura Y. Chem. Lett. 7:2001;642-643.
15. Chen Z.H., Dahn J.R. Electrochem. Solid-State Lett. 6:2003;A221.
16. Chen Z.H., Dahn J.R. Electron. Solid-State Lett. 5(10):2002;A213-A216.
17. Y. Wang, M. Zhang, Q. Zhong, J.N. Reimers, U. von Sacken, in: Proceedings of the Electrochemical Society Fall meeting, Honolulu, Hawaii, 1999 (extended abstract #371).
18. Aurbach D., Markovsky B., Rodkin A., Levi E., Cohen Y.S., Palchik O., Kim H.-J., Schmidt M. Electrochim. Acta. 47:2002;4291.
19. Chen Z.H., Dahn J.R. Electrochem. Solid-State Lett. 7:2004;A11.
20. Y. Gao, M. Yakovleva, H.H. Wang, J.F. Engel, US Patent 2002/0015887,A1.
21. Xu K., Zhang S., Jow T.R., Xu W., Angell C.A. Electrochem. Solid-State Lett. 5(1):2001;A26.
22. Xu W., Angell C.A. Electrochem. Electrochem. Solid-State Lett. 4:2001;E1.
23. Z.H. Chen, Ph.D. Thesis, Dalhousie University, 2003.
24. Ohzuku A., Ueda A. J. Electrochem. Soc. 141(11):1994;2972.
25. Amatucci G.G., Tarascon J.M., Klein L.C. J. Electrochem. Soc. 143(3):1996;1114.
26. Van der Ven A., Aydinol M.K., Ceder G. Phys. Rev. B. 58:1998;2975.
27. Van der Ven A., Aydinol M.K., Ceder G. J. Electrochem. Soc. 145(6):1998;2149.
28. Sun X., Yang X.Q., McBreen J., Gao Y., Yahovleva M., Xing X.K., Daroux M.L. J. Power Sources. 97-98:2001;274.
29. Chen Z.H., Lu Z., Dahn J.R. J. Electrochem. Soc. 149(12):2002;A1604.