Structural and electrical properties of Ba0.5Sr 0.5TiO3 thin films for tunable microwave applications

Materials Research Society Symposium Proceedings

Volumn 811, Issue , 2004, Pages 411-418

  Manavalan, Sriraj G ^a,b   Kumar, Ashok ^a,b   Weller, T ^a   Sikder, A K ^b  

^a University of South Florida   (United States)

^b UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; MICROWAVE DEVICES; OPTIMIZATION; PULSED LASER DEPOSITION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CRITICAL PARAMETERS; DIELECTRIC LOSS; MICROWAVE FREQUENCIES; SURFACE ANALYSIS;

BARIUM COMPOUNDS;

EID: 12744266541     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-811-e3.4     Document Type: Conference Paper

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