An ellipsometric study of manganese oxide films: In situ characterization of the deposition and electroreduction of MnO2

Journal of the Electrochemical Society

Volumn 152, Issue 1, 2005, Pages

  Ubeda, M Hernández ^a   Perez M A ^b   Mishima, H T ^a   Villullas, H M ^b,d   Zerbino, J O ^c   De Mishima, B A López ^a   Teijelo, M López ^b  

^a UNIVERSIDAD NACIONAL DE SANTIAGO DEL ESTERO   (Argentina)

^b DEPARTAMENTO DE FISICOQUÍMICA   (Argentina)

^c INSTITUTO DE INVESTIGACIONES FISICOQUÍMICAS TEÓRICAS Y APLICADAS INIFTA   (Argentina)

^d SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DIFFUSION; ELECTROCHEMISTRY; ELECTRODEPOSITION; ELECTROLYTES; ELLIPSOMETRY; MATHEMATICAL MODELS; PRECIPITATION (CHEMICAL); RAMAN SPECTROSCOPY; REDUCTION; REFRACTIVE INDEX; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTROCHEMICAL FILMS; MANGANESE OXIDE FILMS; OPTICAL RESPONSE; STEP POTENTIAL ELECTROCHEMICAL SPECTROSCOPY (SPES);

MANGANESE COMPOUNDS;

EID: 12744255073     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1825951     Document Type: Article

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