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Volumn 8, Issue 2, 1997, Pages 113-117

The ellipsometry of anisotropic manganese dioxide films electrodeposited at anodic potentials

Author keywords

Anisotropy; Ellipsometry; Manganese oxide

Indexed keywords


EID: 3042903925     PISSN: 01035053     EISSN: None     Source Type: Journal    
DOI: 10.1590/S0103-50531997000200005     Document Type: Article
Times cited : (3)

References (44)
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    • (1959) Proc. Int. Conf. Bolton Landing
    • Bean, C.P.1
  • 35
    • 0024106695 scopus 로고
    • Ruetschi, P. J. Electrochem. Soc. 1988, 135, 2657. Ruetschi, P.; Giovanoli, R. Idem 1988, 135, 2663.
    • (1988) J. Electrochem. Soc. , vol.135 , pp. 2657
    • Ruetschi, P.1
  • 40
    • 85033182519 scopus 로고    scopus 로고
    • U. S. Patent, 1970, 3, 535, 217
    • Amano, Y. U. S. Patent, 1970, 3, 535, 217; Amano, Y.; Kumano, H.; Nishino, A.; Noguchi, Y. Japanese Patent 1972, 47, 2419.
    • Amano, Y.1
  • 41
    • 85033189551 scopus 로고    scopus 로고
    • Japanese Patent 1972, 47, 2419
    • Amano, Y. U. S. Patent, 1970, 3, 535, 217; Amano, Y.; Kumano, H.; Nishino, A.; Noguchi, Y. Japanese Patent 1972, 47, 2419.
    • Amano, Y.1    Kumano, H.2    Nishino, A.3    Noguchi, Y.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.