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Volumn 226, Issue 3, 2004, Pages 441-446
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Utilisation of a sputtering device for targetry and diffusion studies
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Author keywords
Serial sectioning; Sputtering; Target fabrication
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Indexed keywords
CHARGED PARTICLES;
DIFFUSION;
ION BEAMS;
LENSES;
NUCLEAR PHYSICS;
PLASMAS;
SOLID STATE PHYSICS;
EINZEL LENS;
ION BEAM SPUTTERING;
SERIAL SECTIONING;
SOLID-STATE DIFFUSION;
TARGET FABRICATION;
SPUTTERING;
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EID: 12444296523
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2004.06.027 Document Type: Article |
Times cited : (4)
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References (12)
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