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Volumn 226, Issue 3, 2004, Pages 441-446

Utilisation of a sputtering device for targetry and diffusion studies

Author keywords

Serial sectioning; Sputtering; Target fabrication

Indexed keywords

CHARGED PARTICLES; DIFFUSION; ION BEAMS; LENSES; NUCLEAR PHYSICS; PLASMAS; SOLID STATE PHYSICS;

EID: 12444296523     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.06.027     Document Type: Article
Times cited : (4)

References (12)
  • 9
    • 12444331065 scopus 로고    scopus 로고
    • private communication
    • J.F. Ziegler, private communication, 2000
    • (2000)
    • Ziegler, J.F.1
  • 12
    • 0037135868 scopus 로고    scopus 로고
    • ISOLDE CollaborationLaitinen P.*et al.
    • ISOLDE Collaboration P. Laitinen Phys. Rev. Lett. 89 2002 085902
    • (2002) Phys. Rev. Lett. , vol.89 , pp. 085902


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.