Fast and non-destructive determination of active-layer thickness of LR 115 SSNTD using a color commercial document scanner

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 226, Issue 3, 2004, Pages 365-368

  Yu, K N ^a   Ng, F M F ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Active layer; Commercial document scanner; LR 115; Optical density; Solid state nuclear track detector

Indexed keywords

DENSITY (OPTICAL); ETCHING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; IMAGE QUALITY; NONDESTRUCTIVE EXAMINATION; SCANNING; SOLID STATE DEVICES; X RAY ANALYSIS;

ACTIVE LAYERS; COMMERCIAL DOCUMENT SCANNERS; LR 115; SOLID STATE NUCLEAR TRACK DETECTORS (SSNTD);

RADIATION DETECTORS;

EID: 12444288595     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.06.037     Document Type: Article

References (5)

1. V.A. Nikolaev, and R. Ilic Radiat. Meas. 30 1999 1
2. C.W.Y. Yip, J.P.Y. Ho, V.S.Y. Koo, D. Nikezic, and K.N. Yu Radiat. Meas. 37 2003 197
3. D. Nikezic, and A. Janicijevic Appl. Radiat. Isotop. 57 2002 275
4. C.W.Y. Yip, J.P.Y. Ho, D. Nikezic, and K.N. Yu Radiat. Meas. 36 2003 161
5. F.M.F. Ng, C.W.Y. Yip, J.P.Y. Ho, D. Nikezic, and K.N. Yu Radiat. Meas. 38 2004 1