|
Volumn 2002-January, Issue , 2002, Pages 671-676
|
Low melting point thermal interface material
|
Author keywords
Central Processing Unit; Conducting materials; Contact resistance; Copper; Materials testing; Resistance heating; Surface resistance; Temperature; Thermal conductivity; Thermal resistance
|
Indexed keywords
CONTACT RESISTANCE;
COPPER;
ELECTRIC RESISTANCE;
HEAT RESISTANCE;
INTERFACES (MATERIALS);
LUBRICATING GREASES;
MATERIALS TESTING;
MELTING POINT;
PROGRAM PROCESSORS;
SURFACE RESISTANCE;
SURFACE TESTING;
TEMPERATURE;
THERMAL CONDUCTIVITY OF SOLIDS;
THERMAL CYCLING;
THERMAL INSULATING MATERIALS;
TINNING;
CONDUCTING MATERIALS;
LOW MELTING TEMPERATURES;
LOW THERMAL CONDUCTIVITY;
MANUFACTURING METHODS;
OPERATING TEMPERATURE;
PERFORMANCE DEGRADATION;
RESISTANCE-HEATING;
THERMAL INTERFACE MATERIALS;
THERMAL CONDUCTIVITY;
|
EID: 1242306037
PISSN: 19363958
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ITHERM.2002.1012519 Document Type: Conference Paper |
Times cited : (27)
|
References (8)
|