Structure and Thickness of Natural Oxide Layer on Ultrafine Particle

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 12, 2003, Pages 7489-7492

  Tamura, Koichi ^a   Kimura, Yuki ^a   Suzuki, Hitoshi ^a   Kido, Osamu ^a   Sato, Takeshi ^a   Tanigaki, Toshiaki ^a   Kurumada, Mami ^a   Saito, Yoshio ^b   Kaito, Chihiro ^a  

^a RITSUMEIKAN UNIVERSITY   (Japan)

^b KYOTO PHARMACEUTICAL UNIVERSITY   (Japan)

Author keywords

HRTEM; IR spectra; Natural oxide; Thickness; Ultrafine particles

Indexed keywords

AMORPHOUS MATERIALS; CHROMIUM; CRYSTAL LATTICES; ELECTRON DIFFRACTION; EVAPORATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GROWTH (MATERIALS); MANGANESE; POLYCRYSTALLINE MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

HRTEM; NATURAL OXIDES; ULTRAFINE PARTICLES;

PARTICLE SIZE ANALYSIS;

EID: 1242287967     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.7489     Document Type: Article

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