The mechanical behavior of conductors exposed to short-duration thermal loading

IEEE Transactions on Magnetics

Volumn 41, Issue 1 II, 2005, Pages 256-261

  Watkins, R ^a   Ravi Chandar, K ^a   Satapathy, S ^b  

^a The University of Texas at Austin   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

Constitutive model; Electromagnetic launch; High temperature materials properties; Pulsed tensile tests

Indexed keywords

ELECTRIC CONDUCTORS; ELECTROMAGNETIC LAUNCHERS; STRAIN RATE; SUPERCONDUCTING TRANSITION TEMPERATURE; TEMPERATURE MEASUREMENT; TENSILE TESTING; THERMAL EXPANSION;

CONSTITUTIVE MODEL; HIGH TEMPERATURE MATERIAL PROPERTIES; MELTING POINT; PULSED TENSILE TESTS;

THERMAL LOAD;

EID: 12344327821     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.838740     Document Type: Article

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