Optical characterization of varnish films by spectroscopic ellipsometry for application in artwork conservation

Applied Spectroscopy

Volumn 59, Issue 1, 2005, Pages 94-99

  Polikreti, Kyriaki ^a   Othonos, Andreas ^a   Christofides, Constantinos ^a  

^a UNIVERSITY OF CYPRUS   (Cyprus)

Author keywords

Artwork diagnostics; Picture varnish; Refractive index; Spectroscopic ellipsometry

Indexed keywords

ELLIPSOMETRY; IRRADIATION; PROJECT MANAGEMENT; REFRACTIVE INDEX; RESINS; SOLVENTS;

ARTWORK DIAGNOSTICS; GLASS SUBSTRATES; PICTURE VARNISHES;

VARNISH;

PAINT;

ALGORITHM; ARTICLE; ARTIFICIAL MEMBRANE; CLASSIFICATION; COMPARATIVE STUDY; EVALUATION; METHODOLOGY; PAINTING; REFRACTOMETRY; SPECTROSCOPY; VALIDATION STUDY;

ALGORITHMS; MEMBRANES, ARTIFICIAL; PAINT; PAINTINGS; REFRACTOMETRY; SPECTRUM ANALYSIS;

EID: 12344289234     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702052940594     Document Type: Article

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