The stress state in thermally grown NiO scales

Materials Science Forum

Volumn 251-254, Issue , 1997, Pages 325-332

  Hou, P Y ^a   Cannon, R M ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Diffusion; Growth Stress; Nickel Oxide; Oxidation; Residual Stress; X Ray Diffraction

Indexed keywords

CREEP; DIFFUSION IN SOLIDS; GRAIN BOUNDARIES; HIGH TEMPERATURE EFFECTS; METALLOGRAPHIC MICROSTRUCTURE; MORPHOLOGY; NICKEL COMPOUNDS; OXIDES; RESIDUAL STRESSES; SUBSTRATES; THERMOOXIDATION; X RAY DIFFRACTION ANALYSIS;

COMPRESSIVE GROWTH STRESS;

SCALE (DEPOSITS);

EID: 0031341201     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.251-254.325     Document Type: Article

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