메뉴 건너뛰기




Volumn 40, Issue 2, 2005, Pages 249-255

Correlation between layer thickness and periodicity of long polytypes in silicon carbide

Author keywords

A. Semiconductors; B. Crystal growth; C. X ray diffraction

Indexed keywords

CRYSTAL GROWTH; MATHEMATICAL MODELS; OPTOELECTRONIC DEVICES; POWER GENERATION; SEMICONDUCTOR MATERIALS; SYNCHROTRON RADIATION; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

EID: 12344283949     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2004.10.008     Document Type: Article
Times cited : (19)

References (19)
  • 1
    • 12344307227 scopus 로고    scopus 로고
    • SiCEP
    • Zimmermann U., (2002) SiCEP URL, http://www.ele.kth.se/SiCEP/english/ index.html.
    • (2002)
    • Zimmermann, U.1
  • 2
    • 12344251756 scopus 로고    scopus 로고
    • EEE Network
    • tCORE (2002) EEE Network URL, http://www.eeenet.org/UK.
    • (2002)
  • 10
    • 12344314136 scopus 로고
    • Ph.D Thesis, University of London
    • Fisher G.R., Ph.D Thesis, University of London, 1986.
    • (1986)
    • Fisher, G.R.1
  • 17
    • 12344274308 scopus 로고    scopus 로고
    • Ph.D Thesis, University of London
    • Kelly J.F., Ph.D Thesis, University of London, 2002.
    • (2002)
    • Kelly, J.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.