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Volumn 40, Issue 2, 2005, Pages 249-255
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Correlation between layer thickness and periodicity of long polytypes in silicon carbide
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Author keywords
A. Semiconductors; B. Crystal growth; C. X ray diffraction
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Indexed keywords
CRYSTAL GROWTH;
MATHEMATICAL MODELS;
OPTOELECTRONIC DEVICES;
POWER GENERATION;
SEMICONDUCTOR MATERIALS;
SYNCHROTRON RADIATION;
THERMAL EFFECTS;
X RAY DIFFRACTION ANALYSIS;
HEXAGONAL LAYERS;
LAYER THICKNESS;
LONG POLYTYPES;
SPATIAL EXTENT;
SILICON CARBIDE;
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EID: 12344283949
PISSN: 00255408
EISSN: None
Source Type: Journal
DOI: 10.1016/j.materresbull.2004.10.008 Document Type: Article |
Times cited : (19)
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References (19)
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