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Volumn 250, Issue 1-4, 2001, Pages 187-190
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Long period polytype boundaries in silicon carbide
a
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Author keywords
[No Author keywords available]
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Indexed keywords
BAND STRUCTURE;
COALESCENCE;
SYNCHROTRON RADIATION;
X RAY DIFFRACTION ANALYSIS;
POLYTYPISM;
TOPOGRAPHY DISTRIBUTION;
SILICON CARBIDE;
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EID: 0034831935
PISSN: 00150193
EISSN: None
Source Type: Journal
DOI: 10.1080/00150190108225062 Document Type: Conference Paper |
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Times cited : (4)
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References (13)
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