Charge fluctuations and concentration fluctuations at intermediate-range distances in the disordered network-forming materials SiO2, SiSe 2, and GeSe2

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 17, 2004, Pages 1-6

  Massobrio, Carlo ^a   Celino, Massimo ^b,c   Pasquarello, Alfredo ^d,e  

^a INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

^b ENEA   (Italy)

^c INFM   (Italy)

^d EPFL   (Switzerland)

^e INSTITUT ROMAND DE RECHERCHE NUMÉRIQUE EN PHYSIQUE DES MATÉRIAUX IRRMA   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM DISELENIDE; SELENIDE; SILICON DIOXIDE; SILICON DISELENIDE; UNCLASSIFIED DRUG;

ARTICLE; ATOM; CHEMICAL STRUCTURE; DIFFRACTION; LIQUID; MOLECULAR DYNAMICS; NEUTRON;

EID: 12244297804     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.174202     Document Type: Article

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