Temperature-dependent intermixing of ultrathin Co films grown on Cu(1 0 0)

Surface Science

Volumn 575, Issue 1-2, 2005, Pages 154-162

  Bernhard, T ^a   Pfandzelter, R ^a   Gruyters, M ^a   Winter, H ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

Author keywords

Auger electron spectroscopy; Cobalt; Copper; Ion solid interactions; Metal metal interfaces; Molecular beam epitaxy; Surface segregation

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; COBALT; COPPER; DEPOSITION; FERMI LEVEL; MAGNETISM; MOLECULAR BEAM EPITAXY; PHOTOEMISSION; SCANNING TUNNELING MICROSCOPY; SEGREGATION (METALLOGRAPHY); ULTRAHIGH VACUUM; ULTRATHIN FILMS;

GRAZING INCIDENCE ANGLE; ION-SOLID INTERACTIONS; METAL-METAL INTERFACES; SURFACE SEGREGATION;

FILM GROWTH;

EID: 12244275701     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.11.016     Document Type: Article

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