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Volumn 29, Issue 6, 2004, Pages 620-622

Damage to extreme-ultraviolet Sc/Si multilayer mirrors exposed to intense 46.9-nm laser pulses

Author keywords

[No Author keywords available]

Indexed keywords

GLASS; INTERDIFFUSION (SOLIDS); LASER BEAMS; LASER PULSES; MIRRORS; MULTILAYERS; SCANDIUM; SCANNING ELECTRON MICROSCOPY; SILICON; TRANSMISSION ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION;

EID: 12144290898     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.29.000620     Document Type: Article
Times cited : (35)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.