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Volumn 9, Issue 1, 2001, Pages 35-42

Structure of Sc/Si multilayer mirrors in as-deposited state and after annealing

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPUTER SIMULATION; DEPOSITION; ELECTRON MICROSCOPY; INTERFACES (MATERIALS); PHASE COMPOSITION; SCANDIUM; SILICON; STRUCTURE (COMPOSITION); SURFACE ROUGHNESS; X RAY ANALYSIS;

EID: 0034917431     PISSN: 08953996     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (12)

References (12)
  • 9
    • 0004518680 scopus 로고
    • Powder Diffraction File, Inorganic Phases: International Center for Diffraction Data, ASTM
    • (1985)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.