Studies of growth, microstructure, Raman spectroscopy and annealing effect of pulsed laser deposited Ca-doped NBCO thin films

Journal of Physics D: Applied Physics

Volumn 38, Issue 1, 2005, Pages 51-61

  Palai, R ^a,b   Romans, E J ^a   Martin, R W ^a   Docherty, F T ^a   Maas, P ^a   Pegrum, C M ^a  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

^b UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; GROWTH (MATERIALS); MICROELECTRONICS; MICROSTRUCTURE; PARAMETER ESTIMATION; PULSED LASER DEPOSITION; RAMAN SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

FILM PROPERTIES; GROWTH PARAMETERS; MICROELECTRONIC DEVICES; SUBLATTICE VIBRATIONS;

CALCIUM;

EID: 12144251779     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/1/010     Document Type: Article

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