Design and on-wafer measurement of a W-band via-less CPW RF probe pad to micro strip transition

Conference Proceedings - 33rd European Microwave Conference, EuMC 2003

Volumn 1, Issue , 2003, Pages 443-446

  Zheng, G ^a   Kirby, P ^a   Rodriguez A ^b   Papapolymerou, J ^a   Tentzeris, M ^a   Dunleavy, L ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b University of South Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPLANAR WAVEGUIDES; PROBES; SCATTERING PARAMETERS;

3 DB BANDWIDTH; AVERAGE LOSS; AVERAGE VALUES; HIGH RESISTIVITY SILICON; MEASURED RESULTS; MEASUREMENT METHODS; MICROSTRIP TRANSITIONS; ON-WAFER MEASUREMENTS;

SILICON WAFERS;

EID: 11944258961     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMC.2003.1262318     Document Type: Conference Paper

References (8)

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