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Volumn 88, Issue 2, 2005, Pages 147-155

Designing reliability information flows

Author keywords

Fast Field Feedback; Information flow; Product development

Indexed keywords

CUSTOMER SATISFACTION; DECISION MAKING; INFORMATION ANALYSIS; INFORMATION MANAGEMENT; PRODUCT DEVELOPMENT; QUALITY CONTROL; SOFTWARE ENGINEERING;

EID: 11844293399     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ress.2004.07.004     Document Type: Article
Times cited : (5)

References (17)
  • 1
    • 0036499030 scopus 로고    scopus 로고
    • Why do quality and reliability feedback loops not always work in practice: A case study
    • P.A. Molenaar, A.J.M. Huijben, D. Bouwhuis, and A.C. Brombacher Why do quality and reliability feedback loops not always work in practice: a case study Reliab Eng Syst Saf 75 2002 295 302
    • (2002) Reliab Eng Syst Saf , vol.75 , pp. 295-302
    • Molenaar, P.A.1    Huijben, A.J.M.2    Bouwhuis, D.3    Brombacher, A.C.4
  • 7
    • 0033311993 scopus 로고    scopus 로고
    • MIR: The use of reliability information flows as a maturity index for quality management
    • P.C. Sander, and A.C. Brombacher MIR: the use of reliability information flows as a maturity index for quality management Qual Reliab Eng Int 15 1999 439 447
    • (1999) Qual Reliab Eng Int , vol.15 , pp. 439-447
    • Sander, P.C.1    Brombacher, A.C.2
  • 11
    • 0348085359 scopus 로고
    • Product conformance cost
    • H.L. Gilmore Product conformance cost Qual Prog June 1974 16
    • (1974) Qual Prog , pp. 16
    • Gilmore, H.L.1
  • 12
    • 0011814435 scopus 로고
    • Strategy of product quality
    • November-December
    • A.A. Kuehn, and R.L. Day Strategy of product quality Harvard Business Rev, November-December 1962 101
    • (1962) Harvard Business Rev , pp. 101
    • Kuehn, A.A.1    Day, R.L.2
  • 13
    • 0026966054 scopus 로고
    • Are components still the major problem: A review of electronic system and device field failure returns
    • M.G. Pecht, and V. Ramappan Are components still the major problem: a review of electronic system and device field failure returns IEEE Trans Components, Hybrids, Manuf Technol 15 1992 1160 1164
    • (1992) IEEE Trans Components, Hybrids, Manuf Technol , vol.15 , pp. 1160-1164
    • Pecht, M.G.1    Ramappan, V.2
  • 14
    • 0033440842 scopus 로고    scopus 로고
    • Fast elimination of product faults in current series
    • G. Güthenke, and M. Leiters Fast elimination of product faults in current series Total Qual Manage 10 1999 569 575
    • (1999) Total Qual Manage , vol.10 , pp. 569-575
    • Güthenke, G.1    Leiters, M.2
  • 15
    • 0034831866 scopus 로고    scopus 로고
    • Information quality: Meeting the need of the customer
    • I. Salaün, and K. Flores Information quality: meeting the need of the customer Int J Inform Manage 21 2001 21 37
    • (2001) Int J Inform Manage , vol.21 , pp. 21-37
    • Salaün, I.1    Flores, K.2
  • 16
    • 0034247537 scopus 로고    scopus 로고
    • The building bricks of product quality: An overview of some basic concepts and principles
    • T.P.J. Berden, A.C. Brombacher, and P.C. Sander The building bricks of product quality: an overview of some basic concepts and principles Int J Prod Econ 67 1999 3 15
    • (1999) Int J Prod Econ , vol.67 , pp. 3-15
    • Berden, T.P.J.1    Brombacher, A.C.2    Sander, P.C.3
  • 17
    • 0033221610 scopus 로고    scopus 로고
    • MIR: Covering non-technical aspects of IEC61508 reliability certification
    • A.C. Brombacher MIR: Covering non-technical aspects of IEC61508 reliability certification Reliab Eng Syst Saf 66 1999 109 120
    • (1999) Reliab Eng Syst Saf , vol.66 , pp. 109-120
    • Brombacher, A.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.