-
3
-
-
84974307935
-
-
Langford J.I., Louër D., Sonneveld E.J. and Visser J.W., Powder Diffr., 1 (1986) 211-221.
-
(1986)
Powder Diffr.
, vol.1
, pp. 211-221
-
-
Langford, J.I.1
Louër, D.2
Sonneveld, E.J.3
Visser, J.W.4
-
5
-
-
0027544935
-
-
Langford J.I., Boultif A., Auffrédic J.P. and Louër D., J. Appl. Cryst., 26 (1993) 22-33.
-
(1993)
J. Appl. Cryst.
, vol.26
, pp. 22-33
-
-
Langford, J.I.1
Boultif, A.2
Auffrédic, J.P.3
Louër, D.4
-
6
-
-
0000757964
-
Modelling anisotropic crystallite size/microstrain in Rietveld analysis
-
E. Prince & J.K. Stalick Eds. NIST Special Publ. 846
-
Le Bail A., 'Modelling anisotropic crystallite size/microstrain in Rietveld analysis', Accuracy in Powder Diffraction, E. Prince & J.K. Stalick Eds. (NIST Special Publ. 846, 1992) pp. 142-153.
-
(1992)
Accuracy in Powder Diffraction
, pp. 142-153
-
-
Le Bail, A.1
-
7
-
-
0002690488
-
Crystal imperfection broadening and peak shape in the Rietveld method
-
R.A. Young Ed. Oxford:IUCr/OUP
-
Delhez R., de Keijser T.H., Langford, J.I., Louër D., Mittemeijer E.J. and Sonneveld E.J., 'Crystal imperfection broadening and peak shape in the Rietveld method', The Rietveld method, R.A. Young Ed. (Oxford:IUCr/OUP, 1995) pp. 132-166.
-
(1995)
The Rietveld Method
, pp. 132-166
-
-
Delhez, R.1
De Keijser, T.H.2
Langford, J.I.3
Louër, D.4
Mittemeijer, E.J.5
Sonneveld, E.J.6
-
8
-
-
0001185753
-
The use of the Voigt function in determining microstructutal properties from diffraction data by means of pattern decomposition
-
E. Prince & J.K. Stalick Eds. NIST Special Publ. 846
-
Langford J.I., 'The use of the Voigt function in determining microstructutal properties from diffraction data by means of pattern decomposition', Accuracy in Powder Diffraction, E. Prince & J.K. Stalick Eds. (NIST Special Publ. 846, 1992) pp. 110-126.
-
(1992)
Accuracy in Powder Diffraction
, pp. 110-126
-
-
Langford, J.I.1
-
18
-
-
24544461197
-
-
Louër D., Sundberg M., Werner P.-E., Filonenko V.P. and Zibrov I.P., Powder Diffr., 10, 81-85.
-
Powder Diffr.
, vol.10
, pp. 81-85
-
-
Louër, D.1
Sundberg, M.2
Werner, P.-E.3
Filonenko, V.P.4
Zibrov, I.P.5
-
22
-
-
0000560374
-
Analysis of the broadening and changes in position of peaks in an X-ray powder pattern
-
J.B. Cohen & J.E. Hilliard Gordon & Breach, Sci. Pub.: NY
-
Wagner C.N.J., 'Analysis of the broadening and changes in position of peaks in an X-ray powder pattern', Local atomic arrangements studied by X-ray diffraction, J.B. Cohen & J.E. Hilliard (Gordon & Breach, Sci. Pub.: NY, 1966) pp. 219-269.
-
(1966)
Local Atomic Arrangements Studied by X-ray Diffraction
, pp. 219-269
-
-
Wagner, C.N.J.1
-
24
-
-
0001719893
-
-
Louër D., Auffrédic J.P., Langford J.I., Ciosmack D. and Niepce J.C., J. Appl. Cryst., 16 (1983) 183-191.
-
(1983)
J. Appl. Cryst.
, vol.16
, pp. 183-191
-
-
Louër, D.1
Auffrédic, J.P.2
Langford, J.I.3
Ciosmack, D.4
Niepce, J.C.5
|