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Volumn 8, Issue 5, 1998, Pages 109-118

Modélisation et analyse des profils de raies de diffraction X par des solides nanocristallins

Author keywords

[No Author keywords available]

Indexed keywords


EID: 11644320822     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1998515     Document Type: Article
Times cited : (4)

References (28)
  • 6
    • 0000757964 scopus 로고
    • Modelling anisotropic crystallite size/microstrain in Rietveld analysis
    • E. Prince & J.K. Stalick Eds. NIST Special Publ. 846
    • Le Bail A., 'Modelling anisotropic crystallite size/microstrain in Rietveld analysis', Accuracy in Powder Diffraction, E. Prince & J.K. Stalick Eds. (NIST Special Publ. 846, 1992) pp. 142-153.
    • (1992) Accuracy in Powder Diffraction , pp. 142-153
    • Le Bail, A.1
  • 8
    • 0001185753 scopus 로고
    • The use of the Voigt function in determining microstructutal properties from diffraction data by means of pattern decomposition
    • E. Prince & J.K. Stalick Eds. NIST Special Publ. 846
    • Langford J.I., 'The use of the Voigt function in determining microstructutal properties from diffraction data by means of pattern decomposition', Accuracy in Powder Diffraction, E. Prince & J.K. Stalick Eds. (NIST Special Publ. 846, 1992) pp. 110-126.
    • (1992) Accuracy in Powder Diffraction , pp. 110-126
    • Langford, J.I.1
  • 22
    • 0000560374 scopus 로고
    • Analysis of the broadening and changes in position of peaks in an X-ray powder pattern
    • J.B. Cohen & J.E. Hilliard Gordon & Breach, Sci. Pub.: NY
    • Wagner C.N.J., 'Analysis of the broadening and changes in position of peaks in an X-ray powder pattern', Local atomic arrangements studied by X-ray diffraction, J.B. Cohen & J.E. Hilliard (Gordon & Breach, Sci. Pub.: NY, 1966) pp. 219-269.
    • (1966) Local Atomic Arrangements Studied by X-ray Diffraction , pp. 219-269
    • Wagner, C.N.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.